Join us for this Special Free Seminar on
One Day Seminar - Your Date Choice
We hope that you can plan to join us for this seminar on Critical Point Drying applications for Low Voltage Field Emission SEM. We are looking forward to sharing information on the latest techniques for streamlining the preparation and subsequent imaging of specimens requiring supercritical drying and subsequent low-voltage high-resolution SEM imaging to reveal the specimen's true surface morphology.
The benefits of Atomic Force Microscopy (AFM) will also be discussed. We will present AFM applications of Biological and Material Science investigations at the nanoscale.
This is a one-day event which will showcase Biological and MEMS/NEMS specimen preparation and SEM inspection.
First 2 pre-registered samples each day will be processed during Customer Demo Session. Please inquire.
Coffee, snacks and a light lunch will be served both days.
We hope to see you there!
* First 2 pre-registered samples each day will be processed during Customer Demo Session. Please inquire.
|Click here to Register the Seminar!|
University of Maryland
Laboratory for Biological
March 27-28, 2013 (Wednesday
Tel: +1.703.620.0304 / +1.301.881.2450