New ! Touch Screen Series C

  • Award winning Software
  • Advanced Hardware design
  • 4", 6" AND 8" Chamber Sizes


  • Stasis Programming
  • Advanced Touchscreen
  • Fully Automatic
  • Multi-Application
  • Multi-Users

Nano Particle
Carbon Nanotubes

Non-Cleanroom Critical Point Dryers

Advanced Manual to Fully Automatic Systems

X-Ray Reference Standards

The tousimis X-Ray Microanalysis Reference Standards since 1957 can be used in the EDS or WDS modes.

Critical Point Dryer Applications

Upcoming Exhibitions and Conferences

Visit us at The Oklahoma Microscopy Society (OMS)
Spring meeting 2017

Date: April 28, 2017

Location: Sam Noble Oklahoma Museum of Natural History, Norman, Oklahoma

Visit us at The the SEMS 53rd annual meeting

Date: May 25, 2017

Location: Holiday Inn, Athens, Georgia

Visit us at the 19th International Conference on
Solid-State Sensors, Actuators and Microsystems
Transducers 2017
Booth # 40

Date: June 19-22, 2017

Location: Kaohsiung Exhibition Center, Kaohsiung, Taiwan

Visit us at The Mid-Atlantic Directors and Staff
of Scientific Cores (MAS SSCi) 2017 Meeting

Date: June 19 - 21, 2017

Location: Morgantown, West Virginia